A micro-scale strain rosette for residual stress measurement by SEM Moiré method

• 作 者: ZHU RongHua XIE HulMln ZHU Jia
• 机 构: KeyLaboratoryofAppliedMechanics（AML）,SchoolofCivilEngineeringandArchitecture,BeijingAeronauticalManu
• 出 处: 中国科学：物理学、力学、天文学英文版
• 发表日期: 2014年4期
• 关键词: 残余应力测量 微观尺度 应变花 SEM 扫描电子显微镜 GH4169 聚焦离子束 FIB residual stress focused ion beam SE
• 基金项目: supported by the National Basic Research Program of China（Grant Nos.2010CB631005 and 2011CB606105）, the National Natural Science Foundation of China（Grant Nos.90916010,11172151 and 11232008）, Speciali

In this paper,a new method combining focused ion beam(FIB)and scanning electron microscope(SEM)Moirétechnique for the measurement of residual stress at micro scale is proposed.The FIB is employed to introduce stress relief like the macro ring-core me