NUMERICAL CHARACTERIZATION OF CURRENT-INDUCED CHANGESIN SURFACE MORPHOLOGY OF THIN Ag FILMS

• 作 者: A.V.Parian H.G.Chun A.R.Shuour
• 机 构: InstituteofStrengthPhysicsandMaterialsScienceSBRAS,ReMM,TomskPolytechnicalUniversity
• 出 处: 金属学报：英文版
• 发表日期: 2003年4期
• 关键词: 银薄膜 扫描隧道显微镜 表面形态 数字表征 STM STM thin Ag films surface roughness fractal dimensi
• 基金项目: the Korean Science and Engineering Foundation(KOSEF)

The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM).It is established that the loss of conductivity in specimens occurs through depletion of the