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在电子计算机主存贮器的研制过程中,存贮器元件,单元板(以存贮片为主的扦件板)、模体到存贮系统的一系列测试将对主存贮器系统的性能、指标、可靠性以及研制进度带来重要影响。我们在研制某机主存的过程中,从理论分析,实际试验和现实可能性等方面出发,对各级的测试总结了一套方法,现在该主存已正式运转,实践证明经过这一系列的测试是可行的也是有效的。存贮器研制过程中的逐级测试,共分四级:即存贮器单片测试、单元板测试、模体测试和系统测试。各级测试的详细情况分述于下:
In the development of computer main memory, a series of tests of memory element, cell plate (chipset-based cutting board), and mold-to-memory system will affect the main memory system Performance, metrics, reliability and development progress have important implications. In the course of developing a host machine, we have summarized a set of methods for testing at all levels from the aspects of theoretical analysis, practical tests and practical possibilities. Now that the main memory has been formally put into operation, it has been proved that after this series The test is feasible and effective. Memory level in the development process of testing, is divided into four levels: the memory monolithic test, cell board testing, mold testing and system testing. The details of the test at all levels are described below: