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首次将脉宽调制控制芯片（ＵＣ３５２５）用于激光扫描测量系统，解决了激光扫描测量中因不同材料对激光的散射光强不同、不同曲面对激光光强反射各异以及物体表面镜面反射等问题给测量精度带来的严重影响［１］，利用激光扫描系统中的摄像机直接作为光强反馈系统，实现了测量过程中的光强自动控制，有效地降低了光强饱和等问题给测量带来的误差。
The first pulse width modulation control chip (UC3525) for laser scanning measurement system to solve the laser scanning measurement due to different materials on the laser light scattering intensity is different from different surfaces of the laser light intensity reflection and mirror surface reflection The problem to the measurement accuracy of the serious impact [1], the use of laser scanning system directly as the light intensity of the camera feedback system to achieve automatic measurement of light intensity, effectively reducing the light intensity saturation and other issues to the measurement zone To the error.