NiO/C的微波-辅助合成及电容性能研究（英文）

• 作 者: 张传香 戴玉明 贺显聪 巴志新 周衡志
• 机 构: 南京工程学院,江苏省先进结构材料与应用技术重点实验室,
• 出 处: 稀有金属材料与工程
• 发表日期: 2016年05期
• 关键词: 微波辐射 电容性能 NiO/C 定量负载 米粒子 电化学稳定性 循环伏安法 比电容 微波辅助合成 透射电子显微镜

采用微波辅助合成法制备有序介孔碳(OMC)和OMC负载氧化镍(xNiO/C)(x=0.01,0.12,0.04)试样。X射线光电子能谱(XPS),X射线衍射(XRD)、透射电子显微镜(TEM)、电感耦合等离子体(ICP)和循环伏安法(CV)用来测试样品的物化性能。负载了NiO的介孔碳孔径稍有下降,表明纳米粒子嵌入介孔碳的孔壁。然而,负载了适量NiO后的碳仍保留完整的介孔结构及较大的比表面积。ICP数据显示了微波-辅助法负载NiO的高效性。超过400 F·g~(-1)的高比电容和高电化学稳定性再次证明了该负载方法良好的应用前景。

Ordered mesoporous carbon (OMC) and OMC-supported nickel oxide (xNiO / C) (x = 0.01,0.12,0.04) samples were prepared by microwave assisted synthesis. X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), transmission electron microscopy (TEM), inductively coupled plasma (ICP) and cyclic voltammetry (CV) were used to test the physicochemical properties of the samples. The pore diameter of the mesoporous carbon supported with NiO decreased slightly, indicating that the nanoparticle was embedded in the mesoporous carbon pore wall. However, the carbon with the proper amount of NiO retained intact mesoporous structure and larger specific surface area. The ICP data shows the microwave-assisted loading of NiO for efficiency. The high specific capacitance and high electrochemical stability of more than 400 F · g -1 demonstrate once again the promising application of this loading method.