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为了满足激光等离子体X射线光谱测量的需要,提出了一种利用平面晶体谱仪记录得到的弯曲谱线来进行波长标定的新方法。传统的参考谱线法需要已知两条以上谱线的确切波长才能进行波长标定,而利用弯曲谱线可以在不知道任何谱线信息的情况下进行波长标定。通过对实验中所获得的铝等离子体Heα自发射谱线弯曲图像的分析,得到在目前所使用的谱仪条件下,该方法的波长定标精度可以达到2×10-4 nm。
In order to meet the needs of X-ray spectrometry of laser plasma, a new method of wavelength calibration using curved lines recorded by a planar crystal spectrometer is proposed. Conventional reference spectral methods require that the exact wavelength of more than two spectral lines be known for wavelength calibration, whereas curved lines can be used for wavelength calibration without knowledge of any spectral information. By analyzing the curve of Heα auto-emission line bending images obtained from experiments, the wavelength calibration accuracy of this method can reach 2 × 10-4 nm under the spectrometer conditions currently used.