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在工业界中使用的ＩＣ自动测试系统（ＡＴＥ），必须具有快速测试ＩＣ参数的特点。结合作者在ＡＴＥ系统设计中所做的研究工作，建立了彩色电视集成电路中ＡＦＴ灵敏度和调谐放大器中谐振回路参数的测试数学模型。这两种数学模型经误差分析和实际使用，均证实了在不增加硬件成本条件下，保证系统测试精度又有效地提高测试系统的测试参数的速度。
The IC Automated Test System (ATE) used in the industry must feature fast test IC parameters. Combined with the research work done by the author in ATE system design, a test mathematical model of AFT sensitivity and resonant circuit parameters in a tuned amplifier for color television integrated circuits is established. Error analysis and actual use of these two mathematical models confirm the speed of testing system’s test parameters without increasing the hardware cost and ensuring system test accuracy.