论文部分内容阅读
一分析电镜的发展电子显微镜自发明至今已将近50年的历史了。如今,高性能透射电镜(TEM)的最高分辨率已达1A,放大图象1百万倍以上,用它已可观察到大分子并显示出重原子。五十年代初,透射电镜普遍增加了选区电子衍射装置,使它不仅可用作高放大倍数的形态观察,而且还能进行晶体结构分析,这是电子显微镜的一大进步。可是,透射电镜所利用的仅是透射电子一种信息,未能充分利用电子与固体相互作用所产生的其他信息;它只用于对薄膜样品的观察与分析,也无法进行成份分析和了解元素的分布状况等。扫描电镜所应用的电子扫描技术为解决透射电镜
An analysis of the development of electron microscopy Electron microscopy since its inception nearly 50 years of history. Today, the highest resolution of high-performance transmission electron microscopy (TEM) has reached 1 A, magnifying an image 1 million times more, with which macromolecules have been observed and show heavy atoms. In the early 1950s, transmission electron microscopy generally increased the selection of electron diffraction devices, making it not only for high magnification morphological observation, but also for crystal structure analysis, which is a big step forward in electron microscopy. However, TEM uses only information that is transmitted electronically and fails to take full advantage of other information generated by the interaction of electrons with the solid; it is used only for the observation and analysis of thin film samples and for component analysis and understanding of the elements Distribution and so on. Scanning electron microscopy applied to solve the transmission electron microscopy