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1991年7月12日陕西省兵器工业管理局在我院组织召开了“光学透镜厚度高精度无损测量装置”技术鉴定会。这项科研成果是由我院仪器工程系徐昌杰讲师完成的。“光学透镜厚度高精度无损测量装置”使用双迈克尔干涉系统,以白光作光源,利用白光零级干涉条纹定位精度高的特性,对透镜厚度实行非接触、高精度绝对测量。同时解决了
July 12, 1991 Shaanxi Province Ordnance Industry Authority organized in our hospital, “optical lens thickness of high-precision non-destructive measurement device” technical appraisal. This scientific research achievement is completed by our instructor Xu Changjie instructor. “Optical Lens Thickness High-precision Non-destructive Measuring Device” uses double Michael interferometer system, uses white light as light source, makes use of white light zero-order interference fringe positioning accuracy, and applies non-contact and high-precision absolute measurement to lens thickness. At the same time solved