Reverse Study of a Commercial SRAM with Areal Time SEU Analysis System

• 作 者: Guo Jinlong Mao Guangbo Liu We
• 机 构: 不详
• 出 处: 中国科学院近代物理研究所和兰州重离子研究装置年报:英文版
• 发表日期: 2019年1期
• 关键词: SEU utilize ATTRACTIVE

Reverse engineering has a significant infuence on the dissemination of technology in the electronics industry1.Single Event Upset(SEU)is one of the most common injection faults induced by energetic ions in integrated circuits(ICs),and it's attractive