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This paper reports that bunchy flake-like nano-graphite crystallite films (BNGCFs) were deposited on Si substrates by using the microwave chemical vapour deposition technique. FtLrthermore the BNGCFs were characterized by x-ray diffraction spectra, scanning electron microscopy, Raman spectra and field emission (FE) Ⅰ-Ⅴ measurements, and a lowest tu-on field of 1.5 V/μm, and a high average emission current density of 30 mA/cm2 at a macroscopic electric field of 8.0 V/μm were obtained. The J-E data did not follow the original Fowler-Nordheim (F-N) relation since they were not well represented in the F-N plot by a straight line. A model considering the F-N mechanism, and the statistic effects of FE tip structures has been applied successfully to explain all the FE data observed for E < 8.SV/μm.