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用激光熔出－共振离子化质谱法测定纯铁中及高纯硅片表面的铬。测定含有１０１２原子／ｃｍ２Ｃｒ的信号强度表明本方法可测定低至１０９原子／ｃｍ２的样品，其空间分辨率为０．２ｍｍ，还可进行二维杂质元素分析。
Determination of Chromium in Pure Iron and High Purity Wafer by Laser Melting - Resonance Ionization Mass Spectrometry. Determination of the signal intensity of 1012 atoms / cm2Cr indicates that the method can measure samples down to 109 atoms / cm2 with a spatial resolution of 0.2 mm and also perform two-dimensional impurity elemental analysis.