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一个理想的半导体器件,若处置得当,且按照规范使用,它永远不会损坏。因为半导体器件完全靠电子工作,不存在会磨损的活动部件;而且在正常使用期间,不消耗任何半导体材料。但是,实际上所有的半导体器件均含有最终能导致故障的制造缺陷。其中多数只有轻微的缺陷,它们有较长的使用期(可能超过50年)。但是,交给使用者的常用半导休器件中,约有1%存在着导致早期失效的缺陷。这样的半导体器件,通常在使用的第一年内就失效。它是造成电路早期失灵及电子设备损坏的主要原因。好在有一种方法,可把它们在装机使用之前就检测出来,这就是应力试验法。
An ideal semiconductor device, if handled properly, and used in accordance with the norms, it will never be damaged. Because semiconductor devices operate entirely electronically, there are no moving parts that can wear out; and during normal use, no semiconducting material is consumed. However, virtually all semiconductor devices contain manufacturing defects that can eventually lead to failure. Most of them have minor defects and they have a longer useful life (probably more than 50 years). However, about 1% of the commonly used semiconductor devices delivered to users suffer from defects that lead to early failure. Such semiconductor devices usually fail within the first year of use. It is the primary cause of early failure of the circuit and damage to electronic equipment. Fortunately, there is a way to put them in use before installed on the test, which is the stress test method.