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一、前言应用透射电子显微镜(TEM)技术观察金属薄膜的断裂过程,最早的可能是Wilsdorf的金属Al薄膜的工作.以后,Forsyth和Wilson,Kuhlman-Wilsdorf等人分别对Al-4％Cu的合金,Cu单晶体薄膜中的裂纹扩展进行了TEM的直接观
I. INTRODUCTION Transmission electron microscopy (TEM) was used to observe the fracture process of metal thin films. The earliest possible work was the Wilsdorf metal Al thin film. Later, Forsyth and Wilson, Kuhlman-Wilsdorf et al. , The crack propagation in the Cu single crystal thin film was observed by TEM