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大规模集成的半导体随机存贮器的测试十分复杂,它的测试内容包括直流参数测试、交流参数测试和功能测试.半导体随机存贮器可分为静态存贮器和动态存贮器两类,它的数据位有一位和多位(四位、八位等)之分,引出脚的排列和数目更是没有统一的标准.因此通用的存贮器测试仪的结构十分庞大,一般用小型计算机控制,价格非常昂贵.我们研制的以Motorola公司生产的MEK6800D2单板计算机为主的存贮器功能测试仪具有如下特点:1.机内装有管脚接触判断电路和接触判断程序,因此本机既可作成品测试,也可作生产线的芯片测试.2.采用程控电源
Large-scale integrated semiconductor random access memory testing is very complicated, and its testing includes DC parameter testing, AC parameter testing and functional testing.Semiconductor random access memory can be divided into two types of static memory and dynamic memory, It has one and many bits (four, eight, etc.) of the points, leads to the pin arrangement and the number is no uniform standard.Therefore the general structure of the memory tester is very large, usually with a small computer Control, the price is very expensive.We developed the MEK6800D2 single board computer-based memory function tester produced by Motorola company has the following characteristics: 1. The machine is equipped with pin contact judgment circuit and contact judgment program, so the machine is both Can be used for product testing, but also for the production line chip test .2 using programmable power supply