利用拉曼技术判定氧化物和半导体纳米颗粒的尺度分布(英文)

• 作 者: M.Ivanda K.Furi S.Musi M.Goti M.Risti A.Turkovi A.M.Tonejc I.Derd Z.CrnjakOrel M.Montagna M.Ferrari M.Schmitt K.Babocsi W.Kiefer
• 机 构: Ruder Bokovi Institute, Bijeni ka 54, Zagreb, Croatia,Faculty of Sciences, Department of Physics,
• 出 处: 光散射学报
• 发表日期: 2004年期
• 关键词: 尺度分布 拉曼 纳米 氧化物 半导体 英文 颗粒 sizes HRTEM Figure

This contribution reports on application of low-wavenumber Raman scattering on acoustical vibrational modes of nanoparticles. Theoretical background as well as the experimental results in determination of oxide and semiconductor particle size distribution will be presented.

This contribution reports on application of low-wavenumber Raman scattering on acoustical vibrational modes of nanoparticles. Theoretical background as well as the experimental results in determination of oxide and semiconductor particle size distribution will be presented.