论文部分内容阅读
在77—400K温度范围内测量了Ⅲ—V族合金InP和In_(1-x)Ga_(?)AsyP_(1-y)的电子霍尔迁移率.利用迁移率公式,分析了两种材料的散射机构,得出总杂质密度等材料参数.
The electron Hall mobility of InP and In_ (1-x) Ga_ (?) AsyP_ (1-y) was measured in the temperature range of 77-400 K. The mobility of the two materials Scattering agencies, derived total impurity density and other material parameters.