Design of Accelerated Life Test Plans——Overview and Prospect

• 作 者: Wen-Hua Chen Liang Gao Jun Pan
• 机 构: KeyLaboratoryofReliabilityTechnologyforMechanicalandElectricalProductofZhejiangProvince,CollegeofMec
• 出 处: 中国机械工程学报：英文版
• 发表日期: 2018年1期
• 基金项目: Supported by National Natural Science Foundation of China(Grant No.51275480,51305402,51405447),International Science & Technology Cooperation Program of China(Grant No.2015DFA71400)

Accelerated life test(ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accurately, quickly, and economically. With