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第35届X射线会议于1986年8月4日至8日的美国Denver大学召开,有各国代表335人参加,收到X射线荧光光谱分析方面的文章49篇,X射线衍射分析方面的文章42篇,另有28家X射线分析仪器厂家参加展出。会议报告将刊登在“X射线进展”一书中。
The 35th X-ray Conference was held at Denver University in the United States from August 4 to August 8, 1986. Delegates from 335 countries attended the conference and received 49 articles on X-ray fluorescence spectroscopy. X-ray diffraction analysis 42 Articles, and another 28 X-ray analysis equipment manufacturers to participate in the exhibition. The conference report will be published in the X-ray Progress book.