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目的:观察5种牙本质粘结系统粘结界面纳米渗漏。方法:选取25颗无龋坏成人恒磨牙,随机分为5组;选择4种自酸蚀粘结系统Clearfil S3Bond、i Bond、Clearfil SE Bond、XenoⅢ和1种全酸蚀粘结系统Single Bond2,每组分别应用其中1种粘结系统进行粘结处理。在透射电镜(TEM)下观察牙本质粘结界面的纳米渗漏。结果:应用Single Bond2、XenoⅢ分别与应用Clearfil S3 Bond、i Bond和Clearfil SE Bond比较,牙本质粘接界面的纳米渗漏值差异均显著(P<0.05);自酸蚀粘结剂i Bond、Clearfil S3Bond和Clearfil SE Bond间比较,纳米渗漏值差异均不显著(P>0.05);Single Bond2与XenoⅢ比较,纳米渗漏值差异不显著(P>0.05)。结论:5种牙本质粘结系统的牙本质界面均存在纳米渗漏,自酸蚀粘结技术需进一步完善。
Objective: To observe the nano-leakage of the bonding interface of five dentin bonding systems. METHODS: Twenty-five adult carious molars without caries were selected and randomly divided into 5 groups. Four kinds of self-etching adhesive systems, Clearfil S3Bond, i Bond, Clearfil SE Bond, Xeno Ⅲ, Each group were applied one of the bonding system for bonding. Nano-leakage at the dentin-bonded interface was observed under transmission electron microscope (TEM). Results: Compared with Clearfil S3 Bond, i Bond and Clearfil SE Bond with Single Bond2 and Xeno Ⅲ respectively, there was significant difference (P <0.05) in the nano-leakage of dentin bonding interface; i Bond, There was no significant difference in the value of nano-leak between Clearfil S3Bond and Clearfil SE Bond (P> 0.05). However, there was no significant difference (P> 0.05) between Single Bond2 and Xeno III in the leakage of nano-scale. CONCLUSION: Nano-leakage exists in the dentin interface of the five dentin bonding systems, and the self-etching technique needs to be further improved.