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气敏半导体材料在接触某些气体时,电阻发生变化,这种效应已被应用于气体的监测,而应用中的重要问题之一,是元件的稳定性。对稳定性问题,也已积累了一些经验。从广泛积累的材料来看,造成不稳定的原因可归纳为两种:一种是外因,即外在条件的不统一造成的。这些条件包括环境中各种非欲测气体的干扰、温度的波动、加热电压电流的波动、周围气体的流动等。这些条件在检测时,应当尽量一致,但这不是元件本身的问题。除外部条件外,总有元件本身的内在原因。外因是变化的条件,内因是变化的根据,外因通过内因而起作用。本文试从催化作用的角度,分析一下元件自身的性质及其与稳定性的关系。作为气敏半导体元件的材料,大都为金属氧化物半导体,如SnO_2、ZnO、V_2O_5、V_2O_5
Gas-sensitive semiconductor materials in contact with certain gases, the resistance changes, this effect has been used for gas monitoring, and application of one of the important issues is the stability of the components. We have also accumulated some experience with stability issues. Judging from the widely accumulated materials, the causes of instability can be summed up in two ways: one is the external cause, that is, the unification of external conditions. These conditions include the interference of various non-measured gases in the environment, temperature fluctuations, fluctuations in the heating voltage and current, the flow of ambient gases, and the like. These conditions in the test, should be as consistent as possible, but this is not a problem of the component itself. In addition to external conditions, there are always internal components of the internal reasons. External factors are changing conditions, internal factors are based on changes, external factors through internal factors. This article tries to analyze the nature of the component itself and its relationship with stability from the perspective of catalysis. As the material of the gas-sensitive semiconductor element, most are metal oxide semiconductors such as SnO 2, ZnO, V 2 O 5, V 2 O 5