,Analysis of electro-optical intensity modulator for bunch arrival-time monitor at SXFEL

• 作 者: Jin-Guo Wang Xiao-Qing Liu Lie Feng Wen-Yan Zhang Xing-Tao Wang Bo Liu
• 机 构: Shanghai Institute of Applied Physics, Chinese Academy of Science, Shanghai 201204, China “,”Univers
• 出 处: 核技术（英文版）
• 发表日期: 2019年1期
• 关键词: Bunch arrival-time monitor (BAM) Soft X-ray Free-Electron Laser (SXFEL) High res

A bunch arrival-time monitor (BAM) based on an electro-optical intensity modulation scheme is currently under development at Shanghai Soft X-ray Free-Electron Laser to meet the high-resolution requirements for bunch stability. The BAM uses a radio frequency signal generated by a pickup cavity to modulate the reference laser pulses in an electro-optical intensity modulator (EOM), and the bunch arrival-time information is derived from the ampli-tude change of the laser pulse after laser pulse modulation. EOM is a key optical component in the BAM system. Through the basic principle analysis of BAM, many parameters of the EOM are observed to affect the mea-surement resolution of the BAM system. Therefore, a systematic analysis of the EOM is crucial. In this paper, we present two schemes to compare and analyze an EOM and provide a reference for selecting a new version of the EOM.