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用溶胶-凝胶方法制备Ba1-xSrxTiO3(BST)薄膜材料,研究薄膜的结构和电性能。用XDR及SEM分析了沉积在硅片上的BST薄膜的结构,测试了在空温下BST薄膜的电滞回线及介电特性。
Ba1-xSrxTiO3 (BST) thin films were prepared by sol-gel method to study the structure and electrical properties of thin films. The structure of BST deposited on silicon wafers was analyzed by XDR and SEM. The hysteresis loop and dielectric properties of BST thin films were tested at room temperature.