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一、问题的提出用万用表测量IC引脚的正反向电阻以判断IC及外围故障的方法(称“电阻法测IC”)较为普遍,各刊不时有详细的检修数据发表,但对测试时所用表型不对号的影响讨论甚少,举个最简单的例子,表1为几种不同万用表测得的1N4148正向电阻,可以看出,表型表1 1N4148正向电阻参数不同,结果可能不同(MF47与
First, the question put forward Multimeter to measure the positive and negative resistance of the IC pin to determine the method of IC and peripheral fault (called “resistance method IC”) is more common, published from time to time detailed maintenance data published, but the test There is little discussion of the effect of the phenotypic mismatch. To give the simplest example, Table 1 shows the 1N4148 forward resistance measured by several different multimeters. It can be seen that the phenotypic variation of the 1N4148 forward resistance parameters is different and the result may be Different (MF47 and