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A method for simultaneously extracting the parameters of self-affine fractal surfaces from a single experimental profile of scattered intensity data is proposed. The Levenberg-Marquardt algorithm is introduced to fit the theoretical equation for the scattering intensity profile to the experimental data.A precision system is designed for acquisition of scattering intensity data using the Boxcar integration technique. The surface parameters extracted (root-mean-square roughness w,lateral correlation length ξ,and roughness exponent a) are compared to those obtained using atomic force microscopy.