论文部分内容阅读
惠普公司通讯元件分部(加利福尼亚州纽瓦克市)的Antoni Niedzwieeki第一个发言。他综述了一种用于商用射频和微波元件制造中的测试程序。如他所述,在生产阶段需要测试的项目的多少取决于产品的功能。德州仪器公司(德克萨斯州达拉斯市)的Daren Bridges及其合作者接下来描述了一种通过与被测负载拖泄数据相比对,来确定非线性器件模型精度的技术。这就是定名为“负载拖泄模板”的典型性能实验技术,已用于由修正的Matarka方法推导的1200μm伪晶高电子迁移率晶体管(PHEMT)的模型上。
Antoni Niedzwieeki of Hewlett-Packard Communications Components Division (Newark, CA) made her first statement. He reviewed a test program for manufacturing commercial RF and microwave components. As he said, the number of items that need to be tested during the production phase depends on the product’s capabilities. Daren Bridges of Texas Instruments Incorporated (Dallas, TX) and his collaborators next describe a technique for determining the accuracy of non-linear device models by comparing it to the dragged load of the load being measured. This is a typical performance experimental technique, entitled “Load Dragging Template” and has been used on a 1200μm pseudo-crystalline high electron mobility transistor (PHEMT) model derived from the modified Matarka method.