论文部分内容阅读
本文扼要介绍了把Kaplan－Meier非参数统计理论应用于军用少量样品的长期储存试验中的基本方法的步骤，在不作寿命分布形式假定的前提下，仅从少量失效数来推断试样的可靠性特征，并对不同环境下的试验结果，给出储存试验寿命是否有差异的统计验证方法。这些方法均在计算机上给出数值分析结果。
This paper briefly introduces the steps of applying Kaplan-Meier nonparametric statistical theory to the long-term storage test of a small number of military samples. The reliability of the sample is deduced from a small number of failures without any assumption of the life distribution Characteristics, and test results under different environments, give a statistical verification of whether there is a difference between the stored test life. These methods give numerical analysis results on the computer.