Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation

• 作 者: 王真 江建慧 杨光
• 机 构: Key Laboratory of Embedded Systems and Service Computing Ministry of Education of Shanghai,Departmen
• 出 处: Tsinghua Science and Technology
• 发表日期: 2007年S1期
• 关键词: probabilistic circuits estimating challenges dramatically susceptible consuming

The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits.

The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Therefore, it is imperative to study the reliability of signaling The paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS 85 and 74-series circuits.