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The geometry effect of a vapor cell on the metrology of a microwave electric field is investigated.Based on the splitting of the electromagnetically induced transparency spectra of cesium Rydberg atoms in a vapor cell,high-resolution spatial distribution of the microwave electric field strength is achieved for both a cubic cell and a cylinder cell.The spatial distribution of the microwave field strength in two dimensions is measured with sub-wavelength resolution.The experimental results show that the shape of a vapor cell has a significant influence on the abnormal spatial distribution because of the Fabry-Pérot effect inside a vapor cell.A theoretical simulation is obtained for different vapor cell wall thicknesses and shows that a restricted wall thickness results in a measurement fluctuation smaller than 3％ at the center of the vapor cell.