LB膜的原子力显微镜观测：从微米至分子量级

• 作 者: 杨晓敏 顾忠泽 韦锰
• 机 构: 东南大学
• 出 处: 应用科学学报
• 发表日期: 1995年01期
• 关键词: 原子力显微镜 LB膜 表面形貌 单分子膜 扫描方式 微观结构 样品间 微区 膜表面 直接观测

应用原子力显微镜（ＡＦＭ）直接观测沉积在固体表面的硬脂酸ＬＢ膜微观结构，范围从微米－纳米－分子量级．ＡＦＭ图象直接表征了膜的表面形貌、微观结构以及膜中存在的缺陷．实验中首次获得了较清晰、重复性好的硬脂酸分子结构ＡＦＭ图象．将ＡＦＭ探针作工具，通过增大针尖与样品间的作用力和控制扫描方式，有能力在ＬＢ膜表面微区进行直接的细微划刻，产生出特定的图形．实验中利用该方法直接测定了单分子膜的厚度．

Atomic force microscopy (AFM) was used to directly observe the microstructure of LB film deposited on solid surface, ranging from micron to nanometer to molecular weight. AFM images directly characterize the film surface morphology, microstructure and defects in the film. For the first time in the experiment, clearer and more repeatable AFM images of stearic acid molecules were obtained. Using the AFM probe as a tool, the ability to directly subdivide micrographs of the LB film surface to produce a specific pattern by increasing the force between the needle tip and the sample and controlling the scanning pattern. In the experiment, the thickness of monolayer was measured directly by this method.