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作为光纤陀螺用光源的超辐射发光二极管(SLD)随着工作时间的延续,其性能会发生退化。采用加速老化的实验方法来估算InGaAsP SLD管芯的工作寿命。分别在环境温度373 K和358 K下对5只SLD管芯进行加速老化,并通过对P-t曲线拟合来推算和估计管芯的老化速率和激活能。计算出了器件的激活能平均值约为0.82 eV,SLD管芯在室温下的工作寿命超过106h,可以满足光纤陀螺用光源的寿命要求。对影响SLD管芯可靠性的因素以及管芯的退化机理进行了分析,为研制高可靠性的超辐射发光二极管提供了理论基础。
The performance of a superluminescent diode (SLD), a light source for fiber optic gyroscopes, degrades as the operating time continues. The experimental method of accelerated aging is used to estimate the working life of an InGaAsP SLD die. Five SLD dies were accelerated at ambient temperatures of 373 K and 358 K, respectively, and the aging rate and activation energy of the die were estimated and estimated by fitting P-t curves. The average activation energy of the device is calculated to be about 0.82 eV. The working life of the SLD die exceeds 106h at room temperature, which can meet the life expectancy of the fiber optic gyroscope light source. The factors influencing the reliability of the SLD die and the degradation mechanism of the die are analyzed, which provides a theoretical basis for the development of highly reliable superluminescent diodes.