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研究Sn Ag Cu Fe焊点的本构方程,采用拉伸测试拟合本构模型的9个参数。基于有限元模拟应用Anand模型分析WLCSP30器件Sn Ag Cu Fe焊点的应力-应变响应。结果表明,器件最大应力集中在拐角焊点上表面,Sn Ag Cu Fe焊点应力值明显小于Sn Ag Cu焊点。基于疲劳寿命预测模型,证实微量的Fe可以显著提高Sn Ag Cu焊点疲劳寿命,因此Sn Ag Cu Fe可以替代传统的Sn Pb应用于电子封装。
The constitutive equations of Sn Ag Cu Fe solder joint were studied. Nine parameters of the constitutive model were fitted by tensile test. Anand Model Analysis of Stress - Strain Response of SnAg Cu Fe Solder Joint in WLCSP30 Based on Finite Element Analysis. The results show that the maximum stress of the device is concentrated on the upper surface of the corner solder joint, and the stress of Sn Ag Cu Fe solder joint is obviously smaller than that of Sn Ag Cu solder joint. Based on the fatigue life prediction model, it is confirmed that trace Fe can significantly improve the fatigue life of Sn-Ag Cu solder joints, so Sn Ag Cu Fe can replace the traditional Sn Pb used in electronic packaging.