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针对X射线辐照环境中抗辐射加固技术研究的需求,建立了一种适用于电子系统封闭外壳的X射线屏蔽效能测量方法。以X射线机的轫致辐射输出为基础,通过滤波和多个连续谱的组合,实现了接近考核能谱的辐照X射线输出;利用Li F热释光探测器的优势,研究了X射线能量响应标定和屏蔽效能测量的应用方法。重点开展了20–100 ke V硬X射线辐照下封闭腔体屏蔽效能测量的实验研究,测量结果显示,除照射方向上的穿透X射线外,散射X射线对腔体内部剂量场具有显著的贡献。通过实验方法的建立和测量结果的分析,能为X射线抗辐射加固的结构设计和有效性评估提供实验参考。
In order to meet the needs of research on radiation reinforcement technology in the environment of X-ray irradiation, a method for measuring X-ray shielding effectiveness of a closed enclosure for electronic systems was established. Based on the X-ray radiation output of the X-ray machine, the X-ray output of the X-ray machine was obtained by the combination of filtering and multiple continuous spectra. The X-ray emission Application of Energy Response Calibration and Shielding Effectiveness Measurement. Emphasis is placed on the experimental study of the shielding effectiveness of closed cavity with 20-100 keV hard X-ray irradiation. The measurement results show that scattered X-ray has significant effect on the internal dose field in the cavity except for the penetrating X-ray in the irradiation direction Contributions. Through the establishment of experimental methods and the analysis of measurement results, it can provide experimental reference for structural design and effectiveness evaluation of X-ray radiation-resistant reinforcement.