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考虑不透明漫射基底的反射/发射和半透明介质层的吸收/发射,建立半透明介质层表面红外测温过程的辐射传输模型,采用反向蒙特卡罗法进行模拟,获得探测表面在热像仪的指示辐射温度。与不透明表面红外测温进行比较,分析表面形状、基底发射率ε_s及介质层光学厚度τ的影响。结果表明,半透明介质层表面的指示辐射温度在ε_s<1.0时,随τ的增大而增大,τ≥2时数值趋于ε_s=1.0时的结果,与不透明表面存在较大差异;针对复杂形状或内凹曲面红外测温,不透明表面和半透明介质层表面均受到反射其他部位辐射现象的影响。
Considering the reflection / emission of the opaque diffuse base and the absorption / emission of the translucent dielectric layer, a radiative transfer model of the transmissivity infrared thermometry on the surface of the translucent dielectric layer is established. The inverse Monte-Carlo method is used to simulate the thermography The instrument indicates the radiation temperature. Compared with the opaque surface infrared temperature measurement, the influence of the surface shape, the substrate emissivity ε_s and the optical thickness τ of the dielectric layer was analyzed. The results show that when the indicated radiation temperature on the surface of translucent medium increases with the increase of τ when ε_s <1.0, the result of ε_s = 1.0 when τ ≧ 2 is different from the opaque surface. Complicated shapes or concave surface infrared temperature measurement, opaque surface and translucent dielectric layer surface are subject to other parts of the reflected radiation effects.