Electron beam ion traps and their applications

• 作 者: ZOUYa-Ming RogerHUTTON
• 机 构: TheKeyLabofAppliedIonBeamPhysics,AstronomyDepartment
• 出 处: 核技术：英文版
• 发表日期: 2003年4期
• 关键词: 电子束离子阱 热等离子体诊断 EBIT 多荷带电离子 HCI Electron beam ion traps Hot-plasma diagnostics
• 基金项目: 国家自然科学基金，the Out- standing Young Professor Project of the Ministry of Education of China

A brief introduction to the historical background and current status of electron beam ion traps (EBITs)is presented. The structure and principles of an EBIT for producing highly charged ions are described. Finally,EBITs as a potential tool in hot-plasma d