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本文提出了数字电路可测试性设计的一种新的综合方法。文章借助于数学规划手段完成了数字电路可测试性的自动设计,使电路在设计阶段就能保证有一定的可测试性。
This paper presents a new integrated approach to the design of testability of digital circuits. The article completes the automatic design of the testability of the digital circuit by means of mathematical programming so that the circuit can ensure a certain degree of testability in the design stage.