,Super-resolution and super-sensitivity of entangled squeezed vacuum state using optimal detection s

• 作 者: Jiandong Zhang Zijing Zhang Longzhu Cen Shuo Li Yuan Zhao Feng Wang
• 机 构: Harbin Institute of Technology, Harbin 150001, China“,”Tianjin Jinhang Institute of Technology, Tian
• 出 处: 中国物理B（英文版）
• 发表日期: 2017年9期
• 关键词: entangled squeezed vacuum state quantum metrology parity detection

Interference metrology is a method for achieving high precision detection by phase estimation.The phase sensitivity of a traditional interferometer is subject to the standard quantum limit,while its resolution is constrained by the Rayleigh diffraction limit.The resolution and sensitivity of phase measurement can be enhanced by using quantum metrology.We propose a quantum interference metrology scheme using the entangled squeezed vacuum state,which is obtained using the magic beam splitter,expressed as |Ψ＞ =(|ξ＞|0＞ + |0＞ |ξ＞)/V/2+2/coshr,such as the N00N state.We derive the phase sensitivity and the resolution of the system with Z detection,project detection,and parity detection.By simulation and analysis,we determine that parity detection is an optimal detection method,which can break through the Rayleigh diffraction limit and the standard quantum limit.