论文部分内容阅读
钽粉及其他钽产品和半成品中所含杂质元素的分析,多数采用发射光谱法进行,因而光谱分析结果的可靠性直接影响钽产品的质量。为了实行科学管理,就要确定管理界限,以满足生产和科研工作日益增长的要求。本文根据有是资料,结合多年钽光谱分析的实际情况,运用数理统计的原理,对分析结果允许差的制定及分析数据可靠性等方面的问题进行探讨。一、钽光谱分析及变异系数和含量的关系我们现在所用的钽中杂质发射光谱分析法,其分析条件与部标相同,区别仅在于部标只分析铬、镍、锰、钛、铝、铜、铌7个元素,而现行方法还外加铁、镁、钼、钙、锡、锆、硅共14个杂质元素。自1977年以来,光谱分析钽试样,每次都带内控
Tantalum powder and other tantalum products and semi-finished products contained in the analysis of impurity elements, the majority of emission spectroscopy method, the reliability of spectral analysis results directly affect the quality of tantalum products. In order to implement scientific management, management boundaries must be identified to meet the growing demands of production and scientific research. This article based on the data, combined with many years of tantalum spectral analysis of the actual situation, the use of mathematical statistics principle, the analysis of the results to allow poor development and analysis of data reliability issues. First, the tantalum spectral analysis and the relationship between the coefficient of variation and the content We are now used tantalum impurity emission spectrometry, the analysis of conditions and the same standard, the only difference is that only the standard analysis of chromium, nickel, manganese, titanium, aluminum, copper , Niobium 7 elements, and the current method plus iron, magnesium, molybdenum, calcium, tin, zirconium, silicon, a total of 14 impurity elements. Since 1977, spectral analysis of tantalum samples, each with internal control