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本文评述了高分辨电子显微学中一种求逆问题的方法。此法的实质是把衍射晶体学融合到高分辨电子显微学中。文章阐述了显微像衬度随晶体厚度的变化 ,从而说明当晶体厚度小于临界值时 ,可以合理地把建立在运动学衍射理论基础上的衍射分析方法等引用到高分辨电子显微学中 ,使测得晶体结构和缺陷的分辨率远高于电子显微镜的点分辨本领。文章简要地介绍了方法的原理和过程 ,及其在测定晶体结构和缺陷上的应用
This article reviews a method of inversion in high resolution electron microscopy. The essence of this method is the incorporation of diffraction crystallography into high-resolution electron microscopy. The article expounds the change of the microscopic image contrast with the thickness of the crystal, which shows that when the crystal thickness is less than the critical value, the diffraction analysis methods based on kinetic diffraction theory can be rationally used in high resolution electron microscopy , So that the measured crystal structure and defect resolution is much higher than the point of electron microscope ability to distinguish. The article briefly introduces the principle and process of the method, and its application in the determination of crystal structure and defects