论文部分内容阅读
用大功率的MXP18-HFX射线衍射仪测量了金属与陶瓷连接处的残余应力分布.实验表明,该衍射仪X射线强度高,光斑细,适用于材料残余应力分布的精确测量.通过用它对金属-陶瓷界面应力梯度的测量,为残余应力的缓解提供了依据.
High-power MXP18-HFX diffractometer was used to measure the residual stress distribution at the interface between metal and ceramic. The experiment shows that the diffractometer has high X-ray intensity and fine spot and is suitable for the accurate measurement of the residual stress distribution of the material. The measurement of the stress gradient at the metal-ceramic interface provides the basis for the relaxation of residual stress.