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介绍了一种用于软X射线辐射能量测量的电阻式薄膜量热计。利用电流的欧姆热效应对薄膜量热计的灵敏度进行了标定。在有基底薄膜的标定过程中，采用一维热扩散模型，考虑了金属薄膜向基底的传导热损失。利用电阻式薄膜量热计对聚龙一号装置钨丝阵 Z 箍缩产生的软 X 射线进行了测量，并与平响应 X射线二极管（XRD）探测器的测量结果进行了比较。实验结果表明，电阻式薄膜量热计测量的软 X 射线辐射能量和辐射功率与平响应 XRD 探测器结果在测量不确定度范围内合理地一致。“,”A resistive bolometer which is used to diagnose soft X-ray fluence is described.The bolometer is calibrated with Ohm heating.In the calibration scheme,heat loss into the substrate is considered with a simple one-dimensional heat conduction model.We utilize the bolometer to diagnose soft X-ray fluence of tungsten wire array Z-pinch experiments on PTS.Comparison of the bolometer measurements with a flat spectral response XRD (FSR-XRD)shows that the soft X-ray power and energy measure-ments from bolometers are reasonably consistent with that obtained by FSR-XRD .