Preliminary result of bunch length measurement using a modified Michelson interferometer

• 作 者: LIN Xu-Ling ZHANG Jian-Bing LU
• 机 构: Shanghai Institute of Applied Physics,Graduate University of Chinese Academy of Sciences
• 出 处: 中国物理C
• 发表日期: 2004年期
• 关键词: femtosecond linear accelerator bunch length interferometer hollow retroreflector
• 基金项目: Major State Basic Reasearch Development Program of China

Based on the femtosecond accelerator device which was built at the Shanghai Institute of Applied Physics (SINAP), recently a modified far infrared Michelson interferometer has been developed to measure the length of electron bunches via the optical autocorrelation method.Compared with our former normal Michelson interferometer, we use a hollow retroreflector instead of a flat mirror as the reflective mirror.The experimental setup and results of the bunch length measurement will be described in this paper.