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For some engineering design and manufacturing applications, particularly for evolving and newtechnologies, populations of manufactured components can be heterogeneous and consist ofseveral sub-populations. The co-existence of n subpopulations is particularly common in deviceswhen the manufacturing process is still maturing or highly variable. A new model is developedand demonstrated to simultaneously determine burn-in and age-based preventive replacementpolicies for populations composed of distinct subpopulations subject to stochastic degradation.Unlike traditional burn-in procedures that stress devices to failure, we present a decision rule thatuses burn-in threshold on cumulative deterioration, in addition to burn-in time, to eliminate weaksubpopulations. Only devices with post-burn-in deterioration levels below the burn-in thresholdare released for field operations.Inspection errors are considered when screening burned-indevices. Preventive replacement is employed to prevent failures from occuring during fieldoperation. We examine the effectiveness of such integrated burn-in and preventive replacementpolycies for non-homogeneous populations.Numerical examples are provided to illustrate theproposed procedure. Sensitivity analysis is performed to analyze the impacts of modelparameters on optimal policies. Numerical results indicate there are potential cost savings fromsimutaneouly determining burn-in and maintenance policies as opposed to a traditional approachthat makes decisions on burn-in and maintenance actions separately.