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Capacitive and Solution Resistance Effects on Voltammetric Responses of a Thin Redox Layer Attached
【机 构】
：
Departement de Chimie,Ecole Normale Superieure,24 rue Lhomond,75231 Paris Cedex 05,France
【出 处】
：
The 60th Annual Meeting of The International Society of Elec
【发表日期】
：
2009年8期
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