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Magnetic thin films form a significant fraction of high tech materials used in advanced devices.Hence correct techniques for their measurement form a critical part of the science that underpins technology.In this talk the principles of the measurement of magnetic thin films will be presented including a brief review of the preferred instrumentation and its calibration.A description will be provided of magnetisation reversal processes in terms of reversible and irreversible behaviour and how the latter leads to a time or frequency dependent response.The challenges of measuring materials having their magnetisation lie perpendicular to the plane of the film will also be discussed.Finally a case study of the phenomenon of exchange bias where an antiferromagnet is grown adjacent to a ferromagnet will be presented.