High Resolution Quantitative Work-Function Measurement with PeakForce Kelvin Probe Force Microscopy

来源 :第三届纳米化学前沿论坛(Frontiers of Nanochemistry-2013) | 被引量 : 0次 | 上传用户：falconcarmack

【摘要】

：

Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on t

【作者】

：

Chunzeng Li Stephen Minne Yan Hu Ji Ma Jianli He Henry Mittel Natalia Erina Senti Guo Thomas Muller

【机构】

：

NanoSurfacesDivision,Bruker,112RobinHillRoad,SantaBarbara,CA93117

【出处】

：

第三届纳米化学前沿论坛(Frontiers of Nanochemistry-2013)

【发表日期】

：

2013年6期

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Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale.

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High Resolution Quantitative Work-Function Measurement with PeakForce Kelvin Probe Force Microscopy

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