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  5. The XRD measurement at high pressure by using W kα1 X-ray

The XRD measurement at high pressure by using W kα1 X-ray

来源 :第26届国际高压科学技术大会、第8届亚洲高压科技学术会议暨第19届中国高压科学技术会议(The 26th Interna | 被引量 : 0次 | 上传用户：fffdsa4te
【摘 要】
：
A diffractometer with W Kα1 characteristic X-ray as X-ray source was designed in house.This diffractometer can realize the monochromatic X-ray diffraction of tungsten kα1,through a photon screening te
【作 者】
：
Pengcheng Zhang Ce Ma Yunjiang Li Zuoyong Dou Xiao Tan 
【机 构】
：
Science and Technology on Surface Physics and Chemistry Laboratory,Jiangyou,Sichuan,621908,China
【出 处】
：
第26届国际高压科学技术大会、第8届亚洲高压科技学术会议暨第19届中国高压科学技术会议(The 26th Interna
【发表日期】
：
2017年10期
【关键词】
：
W kα1 X-ray diffractometer phase transformation 
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　　A diffractometer with W Kα1 characteristic X-ray as X-ray source was designed in house.This diffractometer can realize the monochromatic X-ray diffraction of tungsten kα1,through a photon screening technology based on wave-particle dualism of X-ray using CdTe detector.
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