Variation-Aware Soft Error Rate Estimation of Nano-Scale Digital Integrated Circuits

来源 :2015 International Symposium on VLSI Design, Automation and | 被引量 : 0次 | 上传用户：wang605631496

【摘要】

：

Soft error rate SER estimation of nano-scale digital integrated circuits is becoming increasingly important since they are getting aggressively vulnerable to soft errors and process variation.

【作者】

：

Mohsen Raji Fereshte Saeedi Behnam Ghavami Hossein Pedram

【机构】

：

Amirkabir University of Technology,Iran Shahid Ba

【出处】

：

2015 International Symposium on VLSI Design, Automation and

【发表日期】

：

2015年5期

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Soft error rate SER estimation of nano-scale digital integrated circuits is becoming increasingly important since they are getting aggressively vulnerable to soft errors and process variation.

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Variation-Aware Soft Error Rate Estimation of Nano-Scale Digital Integrated Circuits

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