AE-PP45:Depth Profiling of SBS/PET Layered Materials Using Step-scan Phase Modulation FTIR-PAS with

• 作 者: ZHANGPudun;LIBobin;
• 机 构: School of Science, Beijing University of Chemical Technology, Beijing 100029, China
• 出 处: 第13届亚洲化学大会(13th Asian Chemical Congress)
• 发表日期: 2009年期

　　Step-scan phase modulation FTIR-photoacoustic spectroscopy (PAS) provides a way to study the depth profile of layered materials and has been described elsewhere [1,2].In this paper,thermal diffusion length was kept identical through phase modulation in the whole wavenumber region.