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拓扑绝缘体Bi2Se3薄膜的分子束外延生长和输运性质研究
【机 构】
：
中国科学院物理研究所,北京100190
【出 处】
：
第十一届全国扫描隧道显微学学术会议
【发表日期】
：
2010年11期
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